Abstract
In this study, the dependence of the magnetic properties of Sm-Co layers prepared on the Cr underlayers on Sm concentration, sputtering pressure, and power were studied to increase the coercivity of the film and to apply the film to high-density recording media. The film with a coercivity of about 4.5 kOe was prepared by adjusting the conditions. It was confirmed by the analysis of the selected area electron diffraction pattern that the crystal structure in Sm-Co film consists of a mixture of crystallites and amorphous matrix. The D50 of Sm-Co/Cr disk was about 130 kFRPI.
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