Abstract
For trace analysis in high-purity materials by inductively coupled plasma-optical emission spectrometry (ICP-OES), concentration separation is necessary. It was performed by coprecipitation separation with cupferron, and measured by ICP-OES to perform quantitative analysis of Ti, Zr, Hf, V, Nb, Ta, Mo and Ga as impurities in pure iron, iron alloys and iron oxide. The detection limits of the impurities were made smaller by correcting for fluctuation of the emission intensities in measurements and spectral interferences of Fe for the impurities.
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