Abstract
As an introduction of a synchrotron radiation (SR) lecture-series for material science discipline, crystal structure analysis using SR X-ray diffraction is explained. This paper consists of three key words of SR; high brilliance, high resolution, and tunable incident X-ray energy. The former two key words realize precise crystal structural information by conventional methods. Application of resonant X-ray scattering method is able to determine the crystal structure which can not be able to be analyzed by conventional technique.
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