Abstract
The complex permittivity of a material is a fundamental parameter for the design of electronic communication devices, components, and systems. In this study, we measured the complex permittivity of planar solid samples using a commercial material characterization kit (MCK) in the D-band, which is a potential 6G frequency band. The measurement system, which consists of a vector network analyzer and the MCK, is calibrated using gated-reflect-line (GRL) and thru-reflect-line (TRL) methods. The calibrated system measured the scattering parameters of the material under test (MUT). The complex permittivity of the MUT was calculated using an iterative method proposed by the National Institute of Standards and Technology (NIST). The measured results of the samples obtained using the two different calibration methods showed good agreement.
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