Abstract
A new cellgap measurement method is described for reflective TN-LCD (twisted-nematic liquid crystal displays). We investigated reflected-intensity behavior in cell-gap measurement, which is based on reflective polarization analysis. The surface reflection of the sample was found to have a decisive influence on the obtained cellgap value and was taken into account in the new method. The method showed good agreement with a trans-missive cellgap measurement in an experiment using a trans-missive LC cell and external reflector. We applied it to microscopic cellgap mapping using a microscope and a CCD camera system. The obtained map is consistent with the shape of the internal reflector.
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