Abstract
Reversible phase change optical recording material with a new quarternary system of Ag-In-Sb-Te has been studied. The starting material for the Ag-In-Sb-Te system is a combination of AgInTe2 with the chalcopyrite structure and Sb. In this work, we report the basic properties of the Ag-In-Sb-Te films investigated by means of DSC, XRD, ED, and HR-TEM. We also discuss the phase change process of the Ag-In-Sb-Te system.
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