Abstract
This paper describes the principles to determine the distribution of metal elements in a crystal with an x-ray diffraction method. When the elements have similar atomic numbers, the metal distribution is not determined precisely with a conventional x-ray diffraction method. The precision can be improved if we use the anomalous dispersion effect. To determine the distribution of three kinds of elements we need two sets of diffraction data different in x-ray wavelength using anomalous dispersion effect. The anomalous dipersion method is also effective in determining the position of each element in a metal site.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
