Abstract
This article gives an overview of several basic synchrotron radi-ation (SR) X-ray analytical techniques useful for crystallographers for material characterization. They include X-ray fluorescence analysis, X-ray powder diffraction and in plane diffraction analyses, X-ray absorption fine structure analysis and X-ray photoelectron spectroscopy. Utilization of X-ray microbeam and total reflection optics are two key elements of the techniques. Special attention was paid to show the advantage of the introduction of SR to these techniques and to give a hint of SR experiments for those who have never used SR although they have basic knowledge of the techniques.
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