Abstract
In printed electronics technology, the pinholes in the printed pattern voids can affect the quality or performance of printed electronic devices. Therefore, it is important to measure and control the pinholes in printed patterns during the manufacturing process. The pinhole has a three-dimensional (3D) shape and should be measured using a 3D microscope for accurate measurement. However, such equipment is typically too expensive to be acquired by a small-sized company. This paper proposes a measurement method for pinholes in printed patterns, involving pattern images obtained using a relatively inexpensive 2D microscope. The proposed method is based on a pinhole threshold index, which defines the boundary between the pinhole and pattern. The actual measurement results are shown to have varying threshold indices. This research contributes to the advancement of the printed electronics industry.
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