Abstract
A principally new method of phase heterogeneity examination based on diffractometric analysis of interference maximum integral intensity of X-ray beam reflections from microvolumes of different sizes in irradiated samples of crystal materials has been developed. Also, some quantitative relationships have been experimentally tested and theoretically justified, namely the dependence of X-ray line integral intensity on the structure of incident radiation, the size of beam projection on the surface of a sample and other survey parameters. Newly developed diffractometric survey of interference line profiles allows to reach an effective averaging in texture heterogeneities that is important for high accuracy and reliable determination of quantitative values of integral intensity. Basing on the above quantitative dependences, necessary relationships have been established to find the values of relative differences between concentrations. New method is advantageous in phase heterogeneity and crystal material porosity analysis as well as in the analysis of the efficiency of blending in multi-phase powder mixtures.
Highlights
Structure heterogeneity in powder products, for example that of crystal phase and pore distribution, significantly influences their quality and physico-mechanical properties
Survey conditions Developing the new method of crystal material heterogeneity examination, the special study has been carried out to determine the influence of beam geometry and survey conditions on the magnitudes of interference maximum integral intensities
Results of phase heterogeneity magnitude determination Let us consider the application of the new method to phase heterogeneity magnitude determination by analyzing the three-phase powder mixture containing CA = 15 %, CA2 = 70 % and
Summary
A principally new method of phase heterogeneity examination based on diffractometric analysis of interference maximum integral intensity of X-ray beam reflections from microvolumes of different sizes in irradiated samples of crystal materials has been developed. Some quantitative relationships have been experimentally tested and theoretically justified, namely the dependence of X-ray line integral intensity on the structure of incident radiation, the size of beam projection on the surface of a sample and other survey parameters. Developed diffractometric survey of interference line profiles allows to reach an effective averaging in texture heterogeneities that is important for high accuracy and reliable determination of quantitative values of integral intensity. Basing on the above quantitative dependences, necessary relationships have been established to find the values of relative differences between concentrations.
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