Abstract
The effect of shape on the bias field of an Ni-Fe/Ti/Co-Zr-Mo trilayer MR element is discussed in relation to the aim ofc ontrolling the bias field of an MR head. In the case of an Ni-Fe single film, the field at half-maximum MR coefficient was found to be proportional to the thickness and reclprocal height. In the case of a trilayer MR element, the saturation bias field was found to be proportional to the Co-Zr-Mo thickness. The bias field was saturated at smaller sense currents, and the saturation bias field increased as the Ti thickness decreased. The use of a Co-Zr-Mo surface oxidation layer instead of a Ti film in the trilayer MR element was effective because the element became a uniform and thin film.
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