Abstract
A superluminescent diode (SLED or SLD) are used in low coherence tomography and in fiber-optic gyroscopes, where sources with a short coherence length and relatively high radiation power are required. SLED are, as a rule, the least reliable, and at the same time, extremely important for ensuring operability device. The article discusses the issue of resource reliability of the SLED to analyze the possibility of improving the accuracy of devices based on them during long-term operation. The work is a brief overview of achievements in the field of resource reliability analysis of quantum optical semiconductor devices, obtaining a general representation of the reliability of superluminescent radiation sources, changes in their parameters as a result of degradation, consideration of ways to solve problems associated with their spectral degradation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
