Abstract
ABSTRACT Recently, the various digital X-ray imaging devices using CCD and TFT LCD-based flat panel digital X-ray sensor are being used. In particular, a number of studies on photon counting sensor technique have been reported. In this study, the incident X-rays fluence on the photon counting sensor material was measured to estimate photon detection efficiency which is the quantitative performance evaluation factor of photon counting sensor. The result of measuring the photon fluence by using RQA-M2 Radiation beam quality of IEC 61223-1-2 recommendations, the incident photon fluence could be defined as about 4 photons/(0.01mm) 2 ․μGy within 10 ㎛ pin-hole area, and about 50 photons/(0.03mm) 2 ․μGy within 30 ㎛ pin-hole area, and about 698 photons/(0.1mm) 2 ․μGy within 100 ㎛ pin-hole area. Consequently, with the previously setup of the incident fluence, the measuring of actual photon counting efficiency by observing the output waveform of the photon counting sensor material was considered possible.
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