Abstract

Currently, the actual direction is the search for functional layers for various optoelectronicdevices. A promising candidate as a basis for many such structures is zinc oxide (ZnO), whichcombines a number of unique optical and photoelectric properties. However, the characteristics ofZnO thin films can vary significantly depending on the chosen synthesis method and specific productionconditions. One of the varieties of the sol-gel method suitable for the synthesis ofnanoscale films is the dip-coating method. The paper presents the results of the synthesis of thinfilms of zinc oxide on glass substrates by the method of vertical drawing from ZnO alcohol sol.The effect of the elongation rate on the structural and optical properties of synthesized ZnO filmswas studied using spectral ellipsometry and spectral photometry. By the method of spectralellipsometry, it was found that the change in the rate of elongation significantly affects the thicknessand porosity of the synthesized zinc oxide layers. The analysis of the obtained dependence ofthe film thickness on the pulling speed showed that in the vertical pulling method, the growth ofzinc oxide on glass substrates can be realized in two modes: in capillary forces mode and in dryingmode. At the same time, transmission spectra were measured for synthesized ZnO films byspectral photometry, the analysis of which showed the effect of the elongation rate on the positionof the edge of fundamental absorption. It was found that the main cause of the resulting.

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