다중 정상 하에서 단일 클래스 분류기법을 이용한 이상치 탐지 : TFT-LCD 공정 사례

Abstract

Novelty detection (ND) is an effective technique that can be used to determine whether a future observation is normal or not. In the present study we propose a novelty detection algorithm that can handle a situation where the distributions of target (normal) observations are inhomogeneous. A simulation study and a real case with the TFT-LCD process demonstrated the effectiveness and usefulness of the proposed algorithm.