Abstract
Purpose: In this study, the defect quantification of thin metal plate was evaluated by using lock-in infrared thermography.BR Methods: A STS304 standard specimens, which had the artificial-defects of different size, were used. The focal distance between the infrared camera and the specimen was set to 500mm, and the distance between the lump and the specimen was set to 200mm. One halogen lamp with a maximum capacity of 1kW was used, and phase-lock infrared thermal images with a frequency of 1Hz were captured and analyzed.BR Result: Objectively quantified data values were obtained by analyzing the contrast ratio and signal-to-noise ratio.BR Conclusion: The possibility of defect diagnosis for thin metal plate was confirmed by using the lock-in infrared thermography technique.
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