Abstract
By using synchrotron light source, X-ray anomalous dispersion effects have been recently applied for structure determination and local structure analysis of complicated materials. In the present report, we overview validities of the method by introducing examples of superstructure determination of PbZrO3and long-periodic structure analysis of Te0.4Se0.6. In addition, application of the method for small angle scattering measurement will be described as a new approach of macro-structure analysis.
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