Abstract
Industrial, electronics goods, and transportation sectors employ power converters for a variety of power conversion applications. Among various reliability challenges in a power converter, capacitor and semiconductor switching devices degradation, caused by aging, are the most notable. The long-term device degradations in capacitors and semiconductor devices may exert negtive impacts on the output performance of power converters. In this study, the impact of an aging capacitor and aging semiconductor switch on a modular multilevel converter (MMC) is presented in detail. Various performances of MMC are measured and quantified through simulation to evaluate the effect of aging devices on converter performance.
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