메탈 그리드 유연 투명 전극의 그리드 형태에 따른 유연 신뢰성 연구

Abstract

Recently, the metal grid electrode drew attention as a flexible transparent conductive electrode for touch screen panels. In metal grid electrodes, various shapes of grid patterns were used to avoid the moiré phenomenon. In this study, we investigated the effects of the metal grid shapes - such as the honeycomb, diamond, and square - on the flexibility and durability of the metal grid film using an experimental and numerical analysis. The flexibility of the metal grid film was evaluated via the following: bending, cyclic bending fatigue and stretching tests; it was compared with the numerical stress analysis. In the bending test, the resistance of the honeycomb grid sample increased by 10% at a bending radius of 10 mm. On the other hand, the diamond grid showed almost no change in resistance up to a bending radius of 6 mm. When the substrate was stretched to 5%, many cracks appeared on the surface of the honeycomb pattern sample. On the other hand, no cracks were found in the diamond pattern sample. Therefore, the diamond pattern exhibited superior flexibility and durability to the honeycomb pattern. The numerical stress analysis also showed that the honeycomb pattern had the highest stress and the diamond pattern had the lowest stress during bending and stretching, which corresponded with the experimental results.