Abstract
Modernization of radio-electronic equipment leads to the need to improve the methods of manufacturing the components that are a part of it. Printed circuit boards are predominantly manufactured using subtractive methods. Under conditions of constant miniaturization, it is necessary to consider the impact of conductor subtractive etching on the performance of the fabricated prototype. In this paper, the effect of etching parameters on the performance of single and coupled microstrip lines is evaluated. An algorithm for evaluating the influence of etching parameters on the characteristics of the considered structures is proposed. In the future it is planned to conduct a laboratory experiment with the extraction of etching coefficients and evaluation of their influence on the characteristics of the considered structures.
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