Abstract

In this paper a signal processing technique for bistatic measurements of the reflection coefficient of flat material samples is presented. This technique is based on comparing the reflected signal from the object under study and the background signal in the time domain. The use of this technique makes it possible to increase the accuracy of measurements of the characteristics of bistatic scattering of objects with a small amplitude of the reflected wave. This technique allows us to offset for the measurement error caused by the inaccuracy of antenna positioning and significantly reduce the measurement error caused by the interaction of antennas with each other at large bistatic angles. The reflection coefficient of the material sample was measured. The obtained results were processed by vector subtraction, time domain and using the developed technique. It was shown that the use of this technique allows one to increase the accuracy of measuring the reflectance of the material. This technique reduces the error in determining the minimum value of the reflection coefficient and the angle at which this minimum is achieved. The most effective is to use background synthesis and time domain together.

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