Abstract
The paper presents the results of experimental studies of the heating dynamics of metal-dielectric structures (MDS) with aluminum conductive nanoscale films deposited by magnetron sputtering on low-cost substrates (glass, sitall, PET and PTFE) under exposure to monochromatic ultrahigh frequency (UHF) fields in a waveguide. At film thicknesses less than 2 nm, the experimental samples had mostly dielectric properties. Noticeable interaction of the films with microwave, causing thermal phenomena, was observed at thicknesses greater than 2 nm and reached a maximum at 5 nm. Thermal degradation processes of the metallized layer manifested in different ways in MDS with solid and polymer (flexible) substrates. Breakdown in conductive films generally occurred at temperatures below the melting temperature of the film material and occurred perpendicular to the electric field strength vector.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Radioelectronics. Nanosystems. Information Technologies.
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
