Abstract
AbstractThe effect of cyclic loading on the magnitude of coherent scattering regions (CSR) of X-ray radiation and microstresses of the II type in various crystalline materials: semiconductor (samarium sulfide) and metal (steel, duralumin) has been found. The loading was carried out by compressing the samples in various ways: all-round, uniaxial, bending compression. It is shown that with an increase in the number of compression cycles, the CSR values in all cases decrease, and the microstresses increase. These values can serve as parameters to assess the degree of mechanical fatigue of the material.
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