Abstract
The correlation between structure configuration of carbon distribution of graphene-contained shungite and its specific electrical conductivity is investigated. The four shungite specimens from different natural depositions are investigated. The carbon structure configuration is investigated by high-permission raster electron microscopy. As a result, there was found cards of graphene layers, graphene packets and graphene ribbons along the plane of specimen surface. The specific electrical conductivity was merit be the four-contact method. On each specimen was found five cards in different its points as a whole – twenty cards. For the analysis of carbon local distribution, the descretization by three levels method was used. This method consists of applying on the card plane the grid with square cells and following analysis of regularity graphene layers by each cell. It is found three levels of order regularity structure: high, middle and low which distinguished by the number and length of graphene layers inside of cell. By averaging along all cards of present specimen for each specimen was found the own numerical characteristic which describes the carbon distribution structure. As a most important parameters were selected the averaged meaning of order degree and inversed value of square deflection from this value. It was found that the dependence of inverted value on specimen from the specimen number has the same character as the dependence on specific conductivity form the same number. As a result of investigations, it was proposed that the specific conductivity of shungite specimen may be found from statistical analysis of carbon space distribution cards which are found by the high-permission raster electron microscopy. It was proposed the algorithm of founding conductivity by analysis carbon configuration cards consisted from 16 successive steps which started from the founding the total combination of cards with the aid of electron microscope and finished by obtaining the electric conductivity value.
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