Abstract

In analog amplifiers of weak signals, the question arises of finding the optimal signal/noise ratio based on noise characteristics for further discretization of the signal by digital methods. Using computer simulations is not a solution to this problem. Because the developers of electronics simulators do not reveal the progress of calculations as usual, or provide the opportunity to independently enter formulas for calculation with the unpredictable probability of forecasting results.In current work, a method for calculating and optimizing the noise level has been developed. It is proposed to be used for debugging circuits based on operational amplifiers, which will save time and money during further testing and optimization of the circuit before its manufacture. And the developers in the datasheet specify the noise parameters without taking into account all the cascade (with open feedback loop, etc.). That is why, a method is needed that takes into account the noise parameters of the switching circuit. The key parameters of the cascades, which have an impact on the reliability of sampling, are among other types: inherent noises of operational amplifiers and thermal noises of the elements of the switching circuit, which are optimized by reduction to a single basis and checked for compliance with the research objectives. In addition, the sequence of actions that establishes the accuracy of discretization of the system with the influence of noise voltage is described.As a result, the solution of the noise level minimization problem by simplified computer calculation is accelerated. Signal-to-noise ratio optimization achieved by non-linear programming method.The proposed method can be used both for analysis discrete and integrated circuits. The results of the work have been used for optimization of the existing analog scheme of the small-caliber spectrometer MiRA_ep that is planning to be launched into low near-Earth orbit to study the nature of the high-energy electron and proton microbursts.

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