Abstract
Using the Ewald method, the analysis a diffraction pattern formation in the interaction of white xray radiation with crystals in the process of diffraction shooting by the ω-scanning method using a point counter is carried out. The influence of such parameters as x-ray voltage x-ray tube and the angular the counter position to the number and intensity of reflections on x-rays. It is shown that the angles between the diffraction maxima on the diffractograms obtained by ω-scanning using white x-ray radiation are equal to the angles between the corresponding crystallographic planes. The angles and crystallographic indices of the reflecting crystals planes of some simple substances were measured using the considered x-ray survey.
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