The shrinkage behaviour of voids arrayed on a bond-interface (grain boundary) is analyzed by computer simulations. It is assumed that surface and interface self-diffusion operate in series. The junction between the void-surface and bond-interface is treated as a tip with a dihedral angle θ. Two numerical models are proposed to discuss the effect of interface and surface tensions on the void shrinkage. One of them always restricts θ to the value of the equilibrium balance (model 1). In the other (model 2), the equilibrium balance is ignored, i.e. the change in θ (free dihedral angle) is considered during the void shrinkage. For discussing the rate controlling step, model 2 is essentially the same as model 1. But, when the void shrinkage is controlled by the interface diffusion, they give void shapes quite different from each other, i.e. when the diffusivity ratio ƒ ⪢ 1 (ƒ = 2δ s D s /δ b D b , where δ s D s and δ b D b are produced by the thickness of the diffusion layer and the self-diffusion coefficient for the surface and interface, respectively), model 1 gives the equilibrium void shape but model 2 only exhibits the stationary void shape. The void morphology is not only influenced by the prescription of the equilibrium balance but also by the diffusivity ratio ƒ. The stress and temperature dependence of the void shrinkage can roughly be expressed by 2 δ s D s δ b D b/[2 δ s D s + δ b D b) P n ], where P is the bonding pressure and n the stress exponent. If θ is prescribed by the equilibrium balance, n increases from −1 to −0.3 with decreasing P. But, if θ changes, n is about −1. It is verified by experiments that the dihedral angle is not always constant and changes as increasing net stress is applied to the bond-interface. It is suggested that model 2 more exactly predicts the void-shrinkage process than model 1 as the pressure is increased.
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