Tool For Material Analysis Research Articles

Limiting Factors for Diffraction in the Gandolfi X-Ray Camera: A Discussion

AbstractOccasional gaps in diffraction arcs are to be expected on “powder films” obtained with the Gandolfi X-ray camera, particularly when the specimen is a single crystal of low symmetry. The geometrical limitations of the method were succinctly and elegantly stated by the worker whose name the camera bears, in work published a quarter of a century ago. Gandolfi also stated a meansibr amelioration of the missing reflections “problem” Numerous authors have made reference to such discrepancies in the intervening period. These minor difficulties notwithstanding, the Gandolfi camera remains a powerful tool for materials analysis.

Silicon surface barrier detector resolution in the 2–30 MeV range

Ordinary backscattering with 4He + ions is a powerful tool for material analysis in thin films. It is well known that both the mass — and depth resolution is improved when heavier projectile ions are used. However, the detector resolution deteriorates as the energy and the mass number of the ions increases. In this work, the detector resolution for the ions 4He, 7Li, 11B, 12C and 16O has been measured. Depth resolution diagrams, using a gold target, were made for the different ions. A comparison of 12C and 16O ions for analysis of GaAs substrates was also performed. The results indicate that sufficient mass resolution was obtained with 12C ions and could therefore be preferred because of the higher counting rate for the lighter ions and subsequent shorter analysing time.