Three-state Device Research Articles

Analysis of Three-State Device Parallel System Subject to Time Varying Open-Mode Failure and Repair Rates

Analysis of Three-State Device Parallel System Subject to Time Varying Open-Mode Failure and Repair Rates

Reliability and Availability Analysis of Three-state Device Redundant Systems with Human Errors and Common-cause Failures

Reliability and Availability Analysis of Three-state Device Redundant Systems with Human Errors and Common-cause Failures

Two reduced formulas for reliability evaluation of three-state device networks

In this paper, we have provided two formulas to reduce the reliability evaluation problems of three-state devices networks to two-state network reliability computation problems. The method effectively simplifies the solving process although profit is still calculated by the technique of L. B. Page and J. E. Perry [L. B. Page and J. E. Perry, Microeleciron. Reliab., 27, 175–178 (1987)].

Reliability of three-state device systems with simultaneous failures

Reliability of three-state device systems with simultaneous failures

A new algorithm for reliability evaluation of three-state device complex networks: Minimal cut-minimal path method

In this paper, we have modified W. J. Ruger's method [W. J. Rueger, Microelectron Reliab. 27, 273–277 (1987)], given a new algorithm to compute the two-terminal reliability of three-state device complex networks. It is a fast, simple method by hand and easily used by computers.

Reliability of 3-state device systems with simultaneous failures

This work is concerned with computing the reliability of redundant systems of three-state (e.g., good, failed-open or failed-short) devices. Allowing for multiple failures, formulas are presented for calculating the reliability of a parallel-series system or a series-parallel system which is formed from three-state, non-DFM (dual failure-mode) devices, and which might require multiple paths to function. The words series and parallel are used in the layout-diagram sense. The formulation encompasses cases which have been analyzed by complex methods in numerous papers on the reliability of three-state DFM device systems. The effects of dominant failure-modes on the relationship between reliability of a series system and that of a parallel system, and on the relationship between the reliability of a parallel-series system and that of series-parallel system are presented. >

Functions of the flagellar modes of rotation in bacterial motility and chemotaxis

Bacteria swim by rotating their flagella, the rotation being due to a motor located at the base of each flagellum. In this paper the correlation between motor function and mode of swimming is reviewed, with special emphasis on recent data that indicate that the motor is a three-state device. Novel findings with regard to the motor function and bioenergetics are surveyed, and mechanisms are proposed to account for these findings.

R&M through avionics/electronics integrity program: Wilbur W. Bhagat. Proc. a. Reliab. Maintainab. Symp., 216 (1989)

A device is said to have three-states if it operates normally in its operational mode but fails in either opened or shorted (closed) modes. This paper presents a repairable k-out-of-n three-state device network model with common-cause failures. Laplace transforms of the state probability equations are developed.

Approximate availability analysis of VAXcluster systems

The availability of an n-processor VAX cluster system is determined using a hierarchical approach that allows: (1) a closed-form answer to an apparently difficult problem to be obtained, and (2) the determination of the optimal number of processors in the cluster for a given set of cluster parameters. The approach is a two-level hierarchical model in which the lower-level model is a nine-state Markov chain that is solved in a closed form. The nine-state Markov chain is then aggregated into a three-state device analogous to a diode. Subsequently, the system availability is computed by analyzing a simple network.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

A note on 3-state systems

D.M. Malon (ibid., vol. 38, p.275-6, Aug. 1989) points out a pitfall of certain reliability problems pertaining to systems of three-state devices. The inference to be drawn from his observation is that special care should be used in describing such systems and in specifying exactly what constitutes success and failure. The present authors (ibid., vol.37, p.388-94, Oct. 1988) have modeled systems that can be represented by a network with designated source and sink; the reliability problem they treated is described by the following two system failures: (1) the system fails (short) if there is a path of short-failed components joining the source and the sink; (2) the system fails (open) if every path joining the source and sink includes an open-failed component. The systems they modeled are therefore somewhat more general then the array structures treated by B.W. Jenney and D.J. Sherwin (ibid., vol.R-35, p.532-8, Dec. 1986). But since the two failure-modes are mutually exclusive, the pitfall that Malon describes does not affect the former. Jenney and Sherwin's difficulties do not arise because of the generality of the systems; rather, they appear in some of the more general reliability measures (such as j-out-of-m requirements) used on the sp-arrays and ps-arrays.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>

Reliability of networks of three-state devices

A three-state device is a device that can exhibit two different types of failure mode, an “open” failure and a “shorted” failure. This paper treats networks whose arcs may experience these two failure modes in addition to the normal “success” state. The network is undirected and has two designated nodes as source and sink. Such a network is itself subject to each of the two failure modes, and the reliability problem considered is computation of the probability of each of the three states of the network. Our observation is that such problems are easily reduced to the usual two-state network reliability problem for which common techniques such as the factoring theorem are readily applicable.

A complex system reliability evaluation method

This paper presents a newly developed method to evaluate reliability of complex systems composed of independent three-state devices. The method is demonstrated with the aid of a hypothetical example of a complex system. In addition, the impact of unit (i.e. three-state device) open and short mode failure probabilities on bridge network reliability is shown.

A method to evaluate reliability of three-state device networks

This paper presents a newly developed probability tree procedure to evaluate reliability of three-state device networks. Reliability networks containing four and five independent and non-identical units are studied with the aid of probability tree approach. Independent unit network configurations such as series, parallel, series-parallel, parallel-series and bridge are analyzed. Expressions for system reliability, open mode and short mode failure probabilities are developed.

The redundancy of two three-state devices

The reliabilities of a three-state device and redundant structures of two such devices are considered, and it is shown that although the two failure modes were equally probable there may be advantages in using redundancy of two devices in series or parallel. It is also shown that the optimal redundant structure of two devices is not solely dependent on the failure mode distribution of the device.

Graphic comparison of three-state device redundancies : Kyung S. Park and Sung S. Kim. Microelectron. Reliab.24, 461 (1984)

Graphic comparison of three-state device redundancies : Kyung S. Park and Sung S. Kim. Microelectron. Reliab.24, 461 (1984)

Graphic comparison of three-state device redundancies

The reliabilities of a single three-state device, a system composed of two such devices in series, and that in parallel are compared directly and their respective optimal regions are shown graphically.

Reliability analysis of two special three-state devices

In this paper Markov models of two special three-state devices are developed. Both of them have a single operating state considered as a good state. The first device has two mutually exclusive failure modes with repair. The second device has two mutually exclusive failure modes, one with repair and another without repair. Functions reliability and availability are computed.

Network reliability evaluation of three-state devices using transformation technique: J. P. Gadani and K. B. Misra. Microelectron. Reliab.21 (2) 231 (1981)

Network reliability evaluation of three-state devices using transformation technique: J. P. Gadani and K. B. Misra. Microelectron. Reliab.21 (2) 231 (1981)

Network reliability evaluation: Application of bathtub failure rate curve

This paper presents reliability evaluation of networks composed of two and three-state devices whose failure rate follows a bathtub curve. Networks reliability equations and (time dependent) curves are presented. Each network reliability time dependent curve is also plotted for the device constant failure rate.

Network reliability evaluation of three-state devices using transformation technique

Equations for delta-star and star-delta transformations are derived for 3-state device networks. These equations are obtained by equating probability of failure for a pair of nodes of both delta and star network. A function minimization method is suggested to solve the nonlinear algebraic equations in case of the star-delta transformation.