We have examined the formation and removal of native surface films on Hg1−xCdxTe (n-type, x=0.2). Samples were etched with a Br-based solution and then characterized by spectroscopic ellipsometry and X-ray photoelectron spectroscopy. A second set of measurements was acquired after these samples were exposed to air. The results confirm the formation of a surface layer consisting primarily of oxide(s) following an etch of the samples. It also appears that elemental Te may be a component of the postetch film. We presently believe that the predominant components of the oxide are TeO2 and CdO. Following the formation of the native oxide we examined its solubility by immersing the samples in several common liquids. While isopropanol and acetone had little effect, de-ionized water, methanol and ethylene glycol each removed significant portions of the HgCdTe surface oxide. Atomic force microscope images suggest that the removal of the surface film may not be entirely uniform. Additionally, it was shown that storage in de-ionized water, methanol, or isopropanol essentially preserves the postetch surface properties.