The ESDIAD method for imaging adsorbate bond directions by photographic observation of positive ion angular distributions during electron stimulated desorption suffers from inherent low contrast due to background effects. The use of a digital acquisition system designed to overcome this difficulty in ESDIAD measurement is presented. Measurements on a Ni(110) single crystal substrate show the presence of a significant background signal due to soft X-ray generation by electron impact. By subtraction of the background signal, a significant enhancement of positive ion signal-to-noise ratio is achieved in ESDIAD, converting the ESDIAD method into a high contrast, high resolution surface measurement technique. Quantitative studies of the soft X-ray background have shown it to be linearly dependent on electron current density and electron energy, with no change in angular shape. These properties permit an accurate background subtraction procedure to be employed to significant;y enhance the capability of the ESDIAD method.
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