AbstractPortable X‐ray Fluorescence Spectrometer (PXRF) is a qualitative and semi‐quantitative elemental analysis method. Recently, many researches using PXRF in the elemental analysis of materials have been reported. However, PXRF has not been extensively applied in forensic science, thus this study is devoted to demonstrate the utility of this technique through a rapid elemental analysis of glass samples for preliminary glass discrimination. Major elements such as Si, O, Ca, Al, and Na, as well as traces of Sr, Rb, K, Fe and Sn, in 25 glass samples were analyzed by PXRF. The amounts of some elements, such as Fe, K, Zr, and Sr, vary in different samples, while other elements, such as Th, are consistent in most tested glass samples. The results show that we can discriminate 98.31 % of 7,500 pair‐wise comparisons created from 25 glass samples. This study establishes PXRF as a new rapid method for the preliminary elemental analysis of glass, which shows a potential to be further applied for discrimination of glass samples in forensic field.
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