With the recent development of diversity electro-optic sampling (DEOS), significant progress has been made in the range of applicability of single-shot EOS measurements, allowing broadband THz waveforms to be captured in a single shot over large temporal windows. In addition to the decrease in acquisition time compared to standard multishot data acquisition, this technique allows measurements on systems far from equilibrium with large shot-to-shot noise or with irreversible or poorly repeatable dynamics. Although DEOS has been demonstrated and verified for linearly polarized THz waveforms, we investigate the effects resulting from the presence of a secondary polarization component. This imposes new challenges for accurate waveform reconstruction, and opens the opportunity to measure out complex polarization states such as arbitrary elliptically polarized THz field. We demonstrate a single-shot diversity-electro-optic-sampling-based approach to capture both x- and y-THz fields simultaneously with a single (110)-cut EO crystal for THz polarimetry and ellipsometry over a wide range of frequencies.
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