We have simulated and measured 60–120fs time jitter of photoelectron pulses emitted by a nitride photocathode at 100GHz rate as in order to evaluate the resolution performance of a previously proposed photonic analog to digital converter. Recently, there has been an increasing demand for high speed analog-to-digital converters (ADCs) for microwave bandwidth signals. State of the art electronic ADCs have reached 10Gigasamples∕second (GS/s), 6–12bit performance [P. W. Juodawlkis, J. C. Twichell, G. E. Betts, J. J. Hargreaves, R. D. Younger, J. L. Wasserman, F. J. O’Donnell, K. G. Ray, and R. C. Williamson, IEEE Microwave Theory Tech. 49, 1840 (2001)]. We have previously introduced a photoelectronic ADC implementation with measured performance of 3bits at 100GS∕s [K. Ioakeimidi, R. Leheny, S. Gradinaru, K. Ma, R. Aldana, J. Clendenin, J. S Harris, R. F. W. Pease, IEEE Trans. Microwave Theory Tech. (to be published); Conference on Lasers and Electro-Optics, Baltimore MD, 1–6 June 2003]. The basic operating principle of the ADC is based on a miniaturized cathode ray tube where a bunch of photoemitted electrons passing through an electric deflection system is directed to a specific detector whence a digital code word emanates. The electron bunch samples the analog deflecting voltage that is then quantized according to the position of the detector receiving the bunch. The fundamental limit of the number of distinguishable voltage levels is the ratio of the deflecting voltage to the energy spread due to diffraction of the electron beam. This allows for up to 12bits at 100GS∕s [R. F. Pease, K. Ioakeimidi, R. Aldana, and R. Leheny, J. Vac. Sci. Technol. B 21, 2826 (2003)]. At a more practical level, the bit resolution is primarily limited by the uncertainty in the emission of each electron bunch (temporal jitter). For 100fs time uncertainty 5bits of resolution are attainable with the nitride cathode for a 50GHz bandwidth analog signal.
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