According to the IEC standards, test objects in back-to-back capacitor bank switching tests are subjected to inrush currents of 20 kA peak and 4250 Hz frequency during making operations. For vacuum interrupters (VIs), the contact surfaces may be seriously damaged by the high-energy arc of the inrush current. The field emission current characteristics reflect the surface microscopic conditions after undergoing the inrush current. The objective of this paper is to investigate the impact of the inrush current during back-to-back capacitor bank making operations on the field emission current characteristics of vacuum interrupters under AC power frequency voltage. The amplitudes of the inrush current were set as 10 and 20 kA, respectively. The sample VIs underwent the inrush current at each amplitude twice. After each inrush current, the field emission current of the VI was measured by applying a power frequency voltage upon the contacts with a fixed gap of 1 mm. By applying an AC power frequency voltage, an unsymmetrical field emission current was measured. In addition, according to the Fowler-Nordheim (F-N) theory, the field enhancement factor β and the effective emission area Ae were calculated. The experimental results show that there is a significant unsymmetrical field emission current at each polarity of the power frequency voltage. Moreover, during the voltage rising phase, the field enhancement factor β is higher and the effective emission area Ae is smaller than that during the voltage falling phase for both positive and negative voltage polarities. A heating-cooling hysteresis effect of the emission sites could explain the phenomena.
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