For remote sensing image scene classification tasks, the classification accuracy of the small-scale deep neural network tends to be low and fails to achieve accuracy in real-world application scenarios. However, although large deep neural networks can improve the classification accuracy of remote sensing image scenes to some extent, the corresponding deep neural networks also have more parameters and cannot be used on existing embedded devices. The main reason for this is that there are a large number of redundant parameters in large deep networks, which directly leads to the difficulty of application on embedded devices and also reduces the classification speed. Considering the contradiction between hardware equipment and classification accuracy requirements, we propose a collaborative consistent knowledge distillation method for improving the classification accuracy of remote sensing image scenes on embedded devices, called CKD. In essence, our method addresses two aspects: (1) We design a multi-branch fused redundant feature mapping module, which significantly improves the parameter redundancy problem. (2) To improve the classification accuracy of the deep model on embedded devices, we propose a knowledge distillation method based on mutually supervised learning. Experiments were conducted on two remote sensing image classification datasets, SIRI-WHU and NWPU-RESISC45, and the experimental results showed that our approach significantly reduced the number of redundant parameters in the deep network; the number of parameters decreased from 1.73 M to 0.90 M. In addition, compared to a series of student sub-networks obtained based on the existing different knowledge distillation methods, the performance of the student sub-networks obtained by CKD for remote sensing scene classification was significantly improved on two different datasets, with an average accuracy of 0.943 and 0.916, respectively.
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