AbstractIn order to carry out high‐precision measurement of the radiation characteristics of antennas and to evaluate the reflection characteristics of microwave anechoic chamber used for antenna measurement, it is important to recognize the location and intensity of the unwanted reflection sources caused by the ambient environment. In this paper, the radiation pattern measurement proposed by the authors is applied for estimating the location of the reflection sources and their effects on the radiation pattern. In the proposed radiation pattern measurement method, the reflected waves are eliminated by the Fourier transform of the measured reflected electric field data obtained on varying the measurement distance. First, a method for estimating the locations of the reflected wave sources and their effects is theoretically shown from the radiation pattern of the reflected wave. This pattern is obtained after the direct radiation pattern obtained from the radiation pattern with the reflected wave suppressed is eliminated from the measured radiation pattern. From a verification experiment using a standard L‐band horn, the effectiveness of the method is verified. Second, a window function is applied to the measurement distance range so that the sidelobes of the Fourier transform spectrum are reduced. From the radiation pattern of the reflected wave obtained by applying a gating process to this Fourier spectrum at each angle, the effect of several reflection sources is estimated individually. From the results of computer simulation, the effectiveness of the proposed method is verified. Further, the range of applicability of the method is discussed. © 2001 Scripta Technica, Electron Comm Jpn Pt 1, 85(4): 33–43, 2002
Read full abstract