Glass frit wafer bonding is a widely used process in the development and production of microsystems, especially for integrating sensors and their signal conditioning circuits. As a result, glass frit bonded wafers must withstand subsequent process modules, such as silicon (wafer) through vias (TSVs) processing. The properties of glass materials for wafer bonding play a crucial role in ensuring the performance and reliability of such wafers. With the advent of new environmental regulations, Lead-free glass frit materials are being developed to replace the current Lead-containing glasses. In this context, four different glass frit materials were investigated and compared in detail, and the bonding behaviors of these materials were analyzed. It was found that the low-melting main components of these glasses determined their properties and performance. The glasses' electrical and chemical properties were also investigated, and their impact on the bonding process was analyzed. The results of this study provide guidance for the process integration of glass frit wafer bonding and open up new possibilities. In addition, the study highlights the need for practical evaluations for specific applications and related details.