The examination of the linear and non-linear optical features was conducted on amorphous ternary Se70Te20 In10 thin films, which were exposed to proton irradiation energy of 3 MeV at varying fluences of 5×1013, 5×1014, 5×1015 and 5×1016 ions/cm2. The bulk sample was produced using the melt quenching method, and subsequently, thin films were obtained through electron beam evaporation. Calculations of linear and non-linear optical parameters were carried out based on transmittance and reflectance data acquired from UV–Vis–NIR spectroscopy spanning 300–2500 nm. Field emission scanning electron microscopy (FESEM) and X-ray diffraction (XRD) confirmed an amorphous phase in the films. The optical parameters showed strong dependency on the proton radiation fluence. In addition, the existence of minima or maxima for a number of parameters at a fluence of 5×1014 ions/cm2 showed that this was the optimum fluence. The linear and non-linear properties showed that the sample have potential applications in photonic devices.
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