The pursuit of enhancing wheat cultivars to meet the challenges of evolving pathogens, quality demands, and yield optimization necessitates a profound understanding of the underlying genetic architecture. This review delves into recent advancements in DNA identification techniques and their pivotal role in elucidating key genetic markers associated with disease resistance, quality attributes, and yield potential in wheat. By integrating genomic tools with traditional breeding methods, researchers have made significant strides in pinpointing genomic regions linked to resistance against major pathogens, including rusts, powdery mildew, and Fusarium head blight. Moreover, the identification of genetic markers governing traits such as grain protein content, dough strength, and micronutrient composition has provided breeders with precise targets for improving wheat quality. Furthermore, the exploration of genomic regions associated with yield-related traits, such as biomass accumulation, flowering time, and stress tolerance, holds promise for enhancing wheat productivity under diverse environmental conditions. This synthesis underscores the importance of leveraging DNA identification strategies to expedite the development of resilient, high-quality, and high-yielding wheat varieties, thus contributing to global food security and sustainability in agriculture.