Langmuir–Blodgett multilayers very often consist of 2D crystallites which scatter light. One way of avoiding this problem is to use preformed polymers but even here there is a difficulty as multilayers formed from them have a poor degree of order in the direction normal to the plane of the film. This defect is exemplified by the fact that a low-angle X-ray diffractogram obtained from such films consists, usually, of 3 or less Bragg peaks and, at the most, 5 observable peaks. In an effort to obtain better order in multilayers both within the plane and normal to it, we have examined the properties of multilayers of a compound which can exist in the smectic A phase and can be polymerised with the aid of UV light while they are in this phase. We have studied the thickness of a number of multilayers of this compound as they go through the phase change using ellipsometric techniques and indeed find a thickness change which corresponds to the change in monolayer thickness found by X-ray diffraction and reported in our earlier studies. The ellipsometer that we have used gives the average thickness of a circular region having a diameter of about 1 mm. In order to obtain a better understanding of the behaviour of films on a much smaller horizontal scale, we have used atomic force microscopy. We display a number of typical cross sections of AFM scans and show that, on a molecular scale, the films are smoother in the smectic phase than they are in the crystalline phase and that polymerisation tends to maintain a film in a smooth condition.
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