Energy Dispersive Total Reflection X-ray Research Articles

Total-reflection X-ray diffraction study of friction-transferred poly(tetrafluoroethylene) film

The orientational structure of the friction-transferred poly(tetrafluoroethylene) (PTFE) film, which consists of highly oriented polymer strands, was evaluated with energy-dispersive total-reflection X-ray diffractometry. In the film, each PTFE molecule is oriented along the friction direction, and PTFE crystallites have a preferred orientation with respect to the substrate surface. The orientational distribution of the chain direction was quantitatively evaluated. The half-width of the distribution was determined to be about 3°. The dependence of the orientational distribution on temperature is discussed. © 2001 John Wiley & Sons, Inc. J Polym Sci B: Polym Phys 39: 432–438, 2001

In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

In order to examine organic thin films during the deposition, we newly developed in situ observation system of an energy dispersive total reflection X-ray diffraction (TRXD) equipped with an organic molecular beam deposition (OMBD). p-Sexiphenyl (6P), which is one of oligophenylenes, is noted as a useful material with unique optical properties by controlling the molecular orientation. To establish the method to control the molecular orientation in 6P thin films prepared by OMBD, 6P thin films on different substrates of silicon oxide (SiO 2) and uniaxially oriented poly( p-phenylene) (PPP) were examined by using in situ TRXD. In the case of the 6P thin films prepared on SiO 2, 6P molecules formed with the normal orientation from the initial process of the deposition. On the other hand, it was observed 6P molecules on the oriented PPP substrates formed with the parallel orientation along the PPP chains. By using out of plane measurements, it was revealed that the (203̄) planes of 6P crystallites preferentially oriented parallel to the substrate surface.

In-plane observations of LiNbO3 thin films by energy dispersive total-reflection x-ray diffractometer

Recently, “In-plane” orientation and lattice spacings of sputtered LiNbO3 films [1] are revealed by using a newly developed Energy Dispersive Total-reflection X-Ray Diffractometer (ED-TXRD) [2].

Structural properties of epitaxially grown perfluoro n-alkanethin films prepared by vapor deposition

Structural and orientational studies of epitaxially grown perfluoro n-alkane(CF 3(CF 2) 18CF 3) thin films evaporated on KCl(001) substrates were conducted by an energy dispersive total reflection X-ray diffractometer. The n-C 20F 42molecules grow epitaxially on the KCl(001) surface owing to the slight interaction between the terminal CF 3 groups and KCl(001), arranging their 〈100〉 hex directions along the KCl 〈110〉 directions. The detailed analysis suggests that most of the molecules crystallize on the epitaxially grown underlayers with the same orientational distribution, although the population of the crystallite with randomly oriented domain structure is slightly increased with increasing thickness. Furthermore, the distorted epitaxial growth with an inclination about ±5° from the KCl 〈110〉 directions was observed and its origin was discussed with respect to the lattice relationship.