Abstract In this study, we investigated Rydberg atom-based microwave electrometry using polarization spectroscopy in a room-temperature vapor cell. By measuring Autler-Townes splitting in the electromagnetically induced transparency (EIT) spectrum, we determined that the minimum measurable microwave electric field is approximately five times lower than conventional EIT techniques. The results are well reproduced by a full optical Bloch equation model, which takes into account all the hyperfine levels involved. Subsequently, the EIT setup was used to characterize a custom microwave cylindrical lens, which increases the field at the focus by a factor of three, decreasing the minimum measurable microwave electric field by the same amount. Our results indicate that the combination of polarization spectroscopy and a microwave lens may enhance microwave electrometry, and may allow its use as a secondary standard.
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