A dual 4-b analog-to-digital converter (ADC) with Nyquist operation to 2 gigasamples/second (Gs/s) and -29-dBc distortion at 1 GHz is presented. A novel evaluation method using an integral digital-to-analog converter is introduced. A trench-isolated, self-aligned, double-polysilicon bipolar process is used for the chip fabrication. This ADC has a resolution of 3.73 effective bits at 1-GHz analog input signal, without the use of a preceding sample-and-hold. Low-frequency untrimmed distortion is -48 dBc (not including quantizing error), and is independent of the sample rate of 2 Gs/s. >