We have measured the intrinsic electrical resistivities,ρ(T), of three individual single-crystalline ZnO nanowires (NWs) from 320 downto 1.3 K. The NWs were synthesized via carbon thermal chemical vapordeposition and the four-probe Pt contacting electrodes were made by thefocused-ion-beam technique. Analysis of the overall temperature behavior ofρ(T) confirms that the charge transport processes in natively doped ZnO NWs are due to acombination of the thermal activation conduction and the nearest-neighbor hoppingconduction processes, as proposed and explained in a recent work (Chiu et al 2009Nanotechnology 20 015203) where the ZnO NWs were grown by a different thermalevaporation method and the four-probe electrodes were made by the electron-beamlithography technique. Taken together, the observations of these two complementarystudies firmly establish that the electrical conduction mechanisms in natively doped ZnONWs are unique and now satisfactorily understood.
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