Industrial defect detection is crucial for enhancing product quality. The diverse nature of industrial scenarios has posed challenges for developing a unified defect detection model that can address multiple industrial scenarios. To meet this challenge, we started from a data perspective, developing three self-designed data acquisition apparatuses to capture defect samples from multiple industrial scenarios. Leveraging grounding DINO (GDINO), an open-set detection approach, we propose a unified defect detection method, MSIDetector. By integrating an industrial feature adapter and a context-aware dual-thresholding defect discriminator, we successfully incorporate prior industrial knowledge into the model. The performance of the MSIDetector was evaluated across four industrial scenarios, including a public defect dataset, achieving a total state-of-the-art mAP@50 of 76.2, surpassing the performance of FasterRCNN, YOLO-7X, and the visual foundation model GDINO, with quantitative increases of 13.93, 6.55, and 2.1, respectively. This report represents the first successful attempt to apply foundation models to defect detection.
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