We describe a new type of spectroscopy based on picosecond transient strain in absorption photomodulation that can be used to detect and identify both allowed and forbidden optical transitions in solid thin films. We have applied the new spectroscopy to a variety of conducting polymer films such as polythiophene, trans and cis polyacetylene, and poly(diethynyl-silane), in which we measured energy levels of various excitonic states with odd and even symmetry that are, respectively, allowed and forbidden in the optical absorption.
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