AbstractIn recent fast pace smart manufacturing environment, the short production runs (SPR) control charts offer a higher degree of flexibility compared to the traditional control charts. This is due to Phase I data collection not needed for SPR control charts and this eases practitioners in estimating the parameters and setting up the control charts. This paper proposes the methods to optimally design the SPR S‐chart and SPR S2‐EWMA control chart for process variance monitoring in terms of truncated average run length (TARL), truncated standard deviation of the run length (TSDRL), and expected truncated average run length (ETARL) performance measures. The optimal parameters in minimizing the TARL and ETARL values for SPR S2‐EWMA control chart are presented. The control chart performances are compared between both the SPR S‐chart and SPR S2‐EWMA control charts. Results show that SPR S2‐EWMA control chart has a higher chart sensitivity and it triggers the out‐of‐control signal faster than the SPR S‐chart. An illustration using the real electronic manufacturing industry data is given in this paper to explain the implementation of the SPR S‐chart and SPR S2‐EWMA control chart.
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