The formation of cracks in glass particles was monitored by application of linearly polarized microwaves. The breakage behavior of glass spheres coated with a thin gold layer of about 50 nm, i.e. a thickness that is lower than the microwave penetration depth, was tested. In this way the investigation of fracture behavior of electronic circuits was simulated. A shielding current was induced in the gold layer by the application of microwaves. During the crack formation the distribution of this current changed abruptly and a scattered microwave signal appeared at the frequency of the incident microwaves. The time behavior of the scattered signal reflects the microscopic processes occurring during the fracture of the specimen. The duration of the increasing signal corresponds to the crack formation time in the tested specimen. This time was estimated as particle size divided by crack development speed in glass. An intense emission of electrons occurs during the formation of cracks. Due to this, coherent Thomson scattering of microwaves by emitted electrons becomes significant with a delay of a few microseconds after the initial phase of crack formation. In this time the intensity of the microwave signal increases.