Atom Probe Tomography Specimen Research Articles

Suppressing Lithium Migration in a Carbon Fiber Negative Electrode During Atom Probe Tomography Analysis.

Carbon fibers can play dual roles, carrying mechanical load and hosting lithium (Li) simultaneously in multifunctional devices called structural batteries. It is essential to gain a detailed understanding on the interaction between Li and carbon fibers on the nanoscale. Atom probe tomography (APT) can potentially reveal individual Li and C atoms. However, lithiated carbon fibers experience massive Li migration once exposed to the electric field in the APT instrument. We show that a few nanometers of a chromium (Cr) coating on APT specimens can shield the electric field and suppress the massive Li migration. The related effects of the Cr coating, such as introduction of oxygen, enhanced mass resolving power of the mass spectrum, and increased portion of single hits, are also discussed.

Atom Probe Tomography of the LiFePO4-Electrolyte Interface Enabled by Thin Film Electrodes

Atom probe tomography (APT) can yield three-dimensional tomographic images at atomic-scale resolution and low-AMU elements such as Li are readily observed, making it a powerful tool for exploring battery materials interfaces. However, it is difficult to prepare APT specimen tips containing the interface of interest starting with typical particle-based battery electrodes. Here we demonstrate a methodology for reliable APT imaging of battery interfaces in which a thin film electrode geometry is used to provide well-controlled planar interfaces that are ideal for APT sample preparation and imaging. LiFePO4 (LFP) thin film electrodes, synthesized using pulsed laser deposition (PLD), were studied as an example system, with standard Li-salt electrolytes. For the results to be applicable to conventional particulate electrodes, it is important to obtain representative thin film structure and electrochemical characteristics. Thus, the effects of PLD conditions including substrate temperature, substrate crystallinity, target composition, and deposition time (number of laser pulses) on the thin film’s crystallographic texture, morphology, and electrochemical performance were studied. Optimized LFP film showed good crystallinity with low-C-rate capacity of ∼90 mAh g−1. Initial APT three-dimensional imaging of the LFP/electrolyte interface shows an ∼10 nm cathode-electrolyte interphase layer that is enriched in F and Li.

Fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy

For atom probe tomography (APT) and transmission electron microscopy (TEM) half grids are commonly applied as specimen carriers, serving as mount for focused ion beam (FIB) processed lift-outs. This technical note presents an alternative way to fabricate half grids directly from the material to be investigated using femtosecond (fs)-laser ablation. After cutting ∼200 µm thin in-plane and cross-plane slices from a TiN coated cemented carbide substrate using a precision cutting saw, two different half grid geometries, one suitable for APT and the other for TEM, were cut via fs-laser processing. Freestanding posts for APT were further sharpened and the areas intended for TEM were thinned top-down using the fs-laser system followed by final annular FIB milling of the APT and thinning of the TEM specimens. For proof of concept, the TiN APT half grid specimens in in- and cross-plane direction were successfully measured in voltage and laser-assisted mode, utilizing a local electrode atom probe, while electron transparency of the in- and cross-plane TEM half grid specimens was proven using a scanning electron microscope equipped with a scanning transmission electron microscopy (STEM) detector. The herein presented method is simple, fast and omits the necessity of a lift-out, reducing the complexity of FIB operations. Additionally, a frequently considered weak point of APT lift-out specimens, the Pt weld between specimen and half grid or microtip coupon is avoided, whilst a wide range of materials can be processed and consumables consumption is reduced. Thus, this work clearly demonstrates the great potential of fs-laser processing for APT and TEM specimen preparation.

Scalable substrate development for aqueous sample preparation for atom probe tomography.

Reliable and consistent preparation of atom probe tomography (APT) specimens from aqueous and hydrated biological specimens remains a significant challenge. One particularly difficult process step is the use of a focused ion beam (FIB) instrument for preparing the required needle-shaped specimen, typically involving a "lift-out" procedure of a small sample of material. Here, two alternative substrate designs are introduced that enable using FIB only for sharpening, along with example APT datasets. The first design is a laser-cut FIB-style half-grid close to those used for transmission-electron microscopy, that can be used in a grid holder compatible with APT pucks. The second design is a larger, standalone self-supporting substrate called a "crown," with several specimen positions that self-aligns in APT pucks, prepared by electrical discharge machining (EDM). Both designs are made nanoporous, to provide strength to the liquid-substrate interface, using chemical and vacuum dealloying. We select alpha brass a simple, widely available, lower-cost alternative to previously proposed substrates. We present the resulting designs, APT data, and provide suggestions to help drive wider community adoption. Lay Description Atom probe tomography (APT) maps the composition of solid materials in three dimensions with sub-nanometre resolution. Preparation of specimens from aqueous specimens remains a significant challenge. To aid with preparation, we introduce here two substrate designs that can hold suitable volumes of liquid for freezing, prior to shaping the final specimen into a sharp needle for APT by using cryogenic focused ion beam milling. We also describe the complete setup that we designed for handling these substrates, including dedicated sample holders. Both substrates are made nanoporous, to provide strength to the liquid-substrate interface, using chemical and vacuum dealloying of alpha brass a simple, widely available, low-cost material. We finally showcase APT data and provide suggestions to help drive wider community adoption. This article is protected by copyright. All rights reserved.

Facilitating the Systematic Nanoscale Study of Battery Materials by Atom Probe Tomography through in‐situ Metal Coating

AbstractThrough its capability for 3D mapping of Li at the nanoscale, atom probe tomography (APT) is poised to play a key role in understanding the microstructural degradation of lithium‐ion batteries (LIB) during successive charge‐ and discharge cycles. However, APT application to materials for LIB is plagued by the field induced delithiation (deintercalation) of Li‐ions during the analysis itself that prevents the precise assessment of the Li distribution. Here, we showcase how a thin Cr‐coating, in‐situ formed on APT specimens of NMC811 in the focused‐ion beam (FIB), preserves the sample's integrity and circumvent this deleterious delithiation. Cr‐coated specimens demonstrated remarkable improvements in data quality and virtually eliminated premature specimen failures, allowing for more precise measurements via. improved statistics. Through improved data analysis, we reveal substantial cation fluctuations in commercial grade NMC811, including complete grains of LiMnO. The current methodology stands out for its simplicity and cost‐effectiveness and is a viable approach to prepare battery cathodes and anodes for systematic APT studies.

Experimental and modelling evidence for hydrogen trapping at a β-Nb second phase particle and Nb-rich nanoclusters in neutron-irradiated low Sn ZIRLO

Zirconium-based alloys used for fuel cladding in nuclear fission reactors are susceptible to hydrogen embrittlement during operation, but we currently lack the necessary mechanistic understanding of how hydrogen behaves in the materials during service to properly address this issue. Imaging the distribution of hydrogen within material microstructures is key to creating or validating models that predict the behaviour and influence of hydrogen on material properties, but is experimentally difficult. Studying hydrogen in zirconium-alloys is further complicated by the fact that the most common routes for preparing specimens for Transmission Electron Microscopy and Atom Probe Tomography (APT) analysis, electropolishing and focused ion beam (FIB) milling, are known to induce hydride formation. This introduces uncertainty as to whether the hydrogen distribution in the analysed specimen is actually representative of the entire sample a priori. Recent work has shown that this effect can be mitigated by performing the final specimen thinning stages at cryogenic temperatures. In this paper we use cryo-FIB to prepare APT specimens of neutron-irradiated low Sn ZIRLO, showing that hydrogen is trapped within a β-Nb SPP and at Nb-rich nanoclusters formed by exposure to neutron irradiation. We then use density functional theory calculations to explain these experimental observations. These results highlight the importance of including niobium-rich features in models used to predict hydrogen pick-up in zirconium alloys during service and delayed hydride cracking during storage.

Optimizing site-specific specimen preparation for atom probe tomography by using hydrogen for visualizing radiation-induced damage

Atom probe tomography (APT) is extensively used to measure the local chemistry of materials. Site-specific preparation via a focused ion beam (FIB) is routinely implemented to fabricate needle-shaped specimens with an end radius in the range of 50 nm. This preparation route is sometimes supplemented by transmission Kikuchi diffraction (TKD) to facilitate the positioning of a region of interest sufficiently close to the apex. Irradiating the specimen with energetic electrons and ions can lead to the generation of vacancies and even amorphization of the specimen. These extrinsically created vacancies become crucial for probing the hydrogen or deuterium distribution since they act as a strong trap. Here, we investigated the feasibility of site-specific preparation of a two-phase medium-Mn steel containing austenite (fcc) and ferrite (bcc). Following gaseous charging of APT specimens in deuterium (D2), clusters enriched by up to 35 at.% D, are imaged after Pt deposition, conventional Ga-FIB preparation, and TKD conducted separately. These D-rich clusters are assumed to arise from the agglomeration of vacancies acting as strong traps. By systematically eliminating these preparation-induced damages, we finally introduce a workflow allowing for studying intrinsic traps for H/D inherent to the material.

Atom probe tomography using an extreme ultraviolet trigger pulse.

Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure of nanoscale specimens with atomic resolution. Modern APT instrumentation most often uses an optical pulse to trigger field ion evaporation-most commonly, the second or third harmonic of a Nd laser is utilized (∼λ = 532 nm or λ = 355 nm). Herein, we describe an APT instrument that utilizes ultrafast extreme ultraviolet (EUV) optical pulses to trigger field ion emission. The EUV light is generated via a commercially available high harmonic generation system based on a noble-gas-filled capillary. The centroid of the EUV spectrum is tunable from around 25eV (λ = 50 nm) to 45eV (λ = 28 nm), dependent on the identity of the gas in the capillary (Xe, Kr, or Ar). EUV pulses are delivered to the APT analysis chamber via a vacuum beamline that was optimized to maximize photon flux at the APT specimen apex while minimizing complexity. We describe the design of the beamline in detail, including the various compromises involved. We characterize the spectrum of the EUV light and its evolution as it propagates through the various optical elements. The EUV focus spot size is measured at the APT specimen plane, and the effects of misalignment are simulated and discussed. The long-term stability of the EUV source has been demonstrated for more than a year. Finally, APT mass spectra are shown, demonstrating the instrument's ability to successfully trigger field ion emission from semiconductors (Si, GaN) and insulating materials (Al2O3).

Transmission Kikuchi Diffraction Mapping Induces Structural Damage in Atom Probe Specimens.

Measuring local chemistry of specific crystallographic features by atom probe tomography (APT) is facilitated by using transmission Kikuchi diffraction (TKD) to help position them sufficiently close to the apex of the needle-shaped specimen. However, possible structural damage associated to the energetic electrons used to perform TKD is rarely considered and is hence not well-understood. Here, in two case studies, we evidence damage in APT specimens from TKD mapping. First, we analyze a solid solution, metastable β-Ti-12Mo alloy, in which the Mo is expected to be homogenously distributed. Following TKD, APT reveals a planar segregation of Mo among other elements. Second, specimens were prepared near Σ3 twin boundaries in a high manganese twinning-induced plasticity steel, and subsequently charged with deuterium gas. Beyond a similar planar segregation, voids containing a high concentration of deuterium, i.e., bubbles, are detected in the specimen on which TKD was performed. Both examples showcase damage from TKD mapping leading to artefacts in the distribution of solutes. We propose that the structural damage is created by surface species, including H and C, subjected to recoil from incoming energetic electrons during mapping, thereby getting implanted and causing cascades of structural damage in the sample.

Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing

Microtip arrays, also called microtip coupons, are routinely used in atom probe tomography (APT) as specimen carriers. They are commercially available consumables, usually made of Si with high electrical conductivity, produced via dedicated shaping techniques. Their purpose is to act as a specimen mount after focused ion beam (FIB) based lift-out procedures. Within this work, an alternative approach to prefabricated microtip coupons is presented, by directly creating a microtip array on the sample to be investigated utilizing fs-laser processing. An exemplary array of microtip posts was fs-laser processed from a TiN coating on Si substrate and subjected to final preparation via annular FIB milling. Subsequently, APT specimen of the TiN coating as well as of the Si substrate were successfully measured in laser assisted mode, using a commercial local electrode APT system. To further emphasize the versatility of the proposed approach, additional voltage measurements of highly conductive B doped Si arrays as well as exemplarily fs-laser processed microtip arrays of various other materials are provided as supplementary material to this article. The presented methodology bypasses the lift-out and avoids the necessity of a Pt weld between specimens and coupon posts which is frequently considered to represent a weak spot. It reduces consumables consumption and provides a high number of specimens in short time, while it is applicable for a wide range of materials and has thus the potential to revolutionize APT specimen preparation.

A Quantitative Investigation of Functionalized Glazing Stacks by Atom Probe Tomography

AbstractInsulating glazings used in products for the building and automotive market consist of flat glass with low‐emissivity (low‐E) coatings. One challenge is to increase the infrared reflectance of the glazing stack while maintaining a high transmittance. This can only be achieved if the chemical interdiffusion between the deposited layers can be controlled and characterized down to the sub‐nanometer level. For that, atom probe tomography (APT) is employed in this work; technique which allows a precise quantification of the chemical interdiffusion in 3D and down to sometimes atomic level. However, the APT specimens prepared using the standard top‐to‐down configuration are prone to systematic fracturing due to strong differences in field evaporation between the layers involved in the glazing stack. The usage of an untypical cross‐section configuration has led to improved yields, but for the latter, artifacts need to be considered and quantified. In particular, the effect of artificial layer intermixing at interfaces due to crossover is studied. It is concluded that Ni diffuses in the Ag layer via grain boundaries already in the as‐deposited state. Hence, this work opens a new perspective in terms of quantification of interdiffusion at early stages, an important finding for low‐E glass applications.

Al2O3 Grain Boundary Segregation in a Thermal Barrier Coating on a Ni-Based Superalloy.

The segregation of reactive elements (REs) along thermally grown oxide (TGO) grain boundaries has been associated to slower oxide growth kinetics and improved creep properties. However, the incorporation and diffusion of these elements into the TGO during oxidation of Ni alloys remains an open question. In this work, electron backscatter diffraction in transmission mode (t-EBSD) was used to investigate the microstructure of TGO within the thermal barrier coating on a Ni-based superalloy, and atom probe tomography (APT) was used to quantify the segregation behavior of REs to α-Al2O3 grain boundaries. Integrating the two techniques enables a higher level of site-specific analysis compared to the routine focused ion beam lift-out sample preparation method without t-EBSD. Needle-shaped APT specimens readily meet the thickness criterion for electron diffraction analysis. Transmission EBSD provides an immediate feedback on grain orientation and grain boundary location within the APT specimens to help target grain boundaries in the TGO. Segregation behavior of REs is discussed in terms of the grain boundary character and relative location in TGO.

Understanding the Effects of Graphene Coating on the Electrostatic Field at the Tip of an Atom Probe Tomography Specimen

Abstract As a three-dimensional characterization method, atom probe tomography can provide key information that other methods cannot offer. Conductive coatings have proved to be an effective way for biological samples, and nonconductive samples in general, to be analyzed using voltage-pulsed atom probe tomography. In this study, we analyzed the effects of graphene coating on an electrically conductive material and were able to confirm the detection of carbon atoms. We compare quantitative electrostatic field metrics for a single-coated and a multi-coated specimen and measure both a reduced voltage after graphene coating and lowered charge-state ratios for different ion species, suggesting a lowered evaporation field related to the graphene coating. This information will be instructive for future studies on graphene-coated, nonconductive biological specimens.

Correlative Site-Specific Sample Preparation for Atom Probe Tomography on Complex Microstructures.

Site-specific specimen preparation for atom probe tomography (APT) is a challenging task. Small features need to be located using a suitable imaging technique and captured within a volume of less than 0.01 μm3. Correlative microscopy has shown to be helpful for target preparation as well as to gain complementary information about the material. Current strategies developed in that direction can be highly time-consuming and not always ensure the correct site extraction in complex microstructures. In this work, we present a methodology to study grain boundaries and interfaces in martensitic steels by combining electron backscattered diffraction, transmission Kikuchi diffraction (TKD), and APT. Furthermore, we include the design of a sample holder that allows to perform TKD and scanning transmission electron microscopy on the specimen during preparation without breaking the vacuum of the scanning electron microscope/focused ion beam workstation. We show a case study where a prior austenite grain boundary is traced from the bulk material to the apex of the APT specimen. The presence of contamination due to the specimen exposure to the electron beam and the use of plasma cleaning to minimize it are discussed.

On the fabrication of atom probe tomography specimens of Al alloys at room temperature using focused ion beam milling with liquid Ga ion source.

In this work, a simple rectangular milling technique was demonstrated to prepare needle shape atom probe tomography (APT) specimens from Al alloys by focused-ion-beam (FIB) milling using Ga+ ions at room temperature. Ga has high miscibility in Al owing to which electropolishing technique is preferred over Ga+ ion FIB instruments for the fabrication of APT specimens. Although, site specific sample preparation is not possible by the electropolishing technique. This led to the motivation to demonstrate a new rectangular milling technique using Ga+ FIB instrument that resulted a significant reduction of Ga+ ion impregnation into the specimens. This is attributed to the reduction of milling time (<30 s at 30 kV acceleration voltage) and the use of lower currents (<0.3nA) compared to the conventional annular milling method. The yield of specimens during field evaporation in APT was also significantly increased from around 8 million ions to more than 86 million ions due to the avoidance of Ga+ ion embrittlement. Therefore, the currently demonstrated rectangular milling technique can be used to prepare APT specimens from Al-alloys and obtained accurate compositions of matrix, phases, and hetero-phase interfaces with Ga < 0.1at%. RESEARCH HIGHLIGHTS: Feasibility of using Ga+ ions for the preparation of needle shaped specimens at room temperature from aluminum alloys. Demonstration of using a rectangular milling technique instead of annular milling technique that led to a significant reduction in impregnation of Ga+ ions into the specimen needles. Due to very low Ga+ ion damage, the yield of the APT data increased by 10-12 times.

Hydrogen and deuterium charging of lifted-out specimens for atom probe tomography.

Hydrogen embrittlement can cause a dramatic deterioration of the mechanical properties of high-strength metallic materials. Despite decades of experimental and modelling studies, the exact underlying mechanisms behind hydrogen embrittlement remain elusive. To unlock understanding of the mechanism and thereby help mitigate the influence of hydrogen and the associated embrittlement, it is essential to examine the interactions of hydrogen with structural defects such as grain boundaries, dislocations and stacking faults. Atom probe tomography (APT) can, in principle, analyse hydrogen located specifically at such microstructural features but faces strong challenges when it comes to charging specimens with hydrogen or deuterium. Here, we describe three different workflows enabling hydrogen/deuterium charging of site-specific APT specimens: namely cathodic, plasma and gas charging. All the experiments in the current study have been performed on a model twinning induced plasticity steel alloy. We discuss in detail the caveats of the different approaches in order to help future research efforts and facilitate further studies of hydrogen in metals. Our study demonstrates successful cathodic and gas charging, with the latter being more promising for the analysis of the high-strength steels at the core of our work.

Impact of the local microstructure fluctuations on radiation-induced segregation in dilute Fe-Ni and Ni-Ti model alloys: A combined modeling and experimental analysis

From a systematic atom probe tomography (APT) characterization of the radiation-induced segregation (RIS) in dilute Fe-Ni and Ni-Ti model alloys, we highlight fluctuations of the solute local concentration up to the scale of the APT specimens. We deduce the RIS at dislocation loops from a solute diffusion equation, that is solved at steady state, within the Voronoi’s volume occupied by a single loop. From a statistical sampling of the Voronoi’s volume and the dislocation loop radius modeled after the characterization of the microstructure by transmission electron microscopy, we provide the full RIS distribution. The present statistical approach of RIS demonstrates that the fluctuation of local solute concentrations in Fe-Ni and Ni-Ti mainly results from the dispersion in size and density of the dislocation loop population. Besides, we highlight the impact of the post-treatment parameters used in the APT protocol on the extracted RIS profiles. In Ni-Ti alloys, the simulated Ti-depletion profiles are in very good agreement with the measured ones. Furthermore, the dispersion of the loop radius and density is shown to play a critical role on the fluctuations of the Ti local concentration. In Fe-Ni, the identification of discrepancies between the simulated Ni-enrichment profiles and the measured ones provides a signature of additional operating mechanisms of the solute redistribution, such as radiation-induced precipitation.

Hydrogen and deuterium charging of site-specific specimen for atom probe tomography

Hydrogen embrittlement can cause a dramatic deterioration of the mechanical properties of high-strength metallic materials. Despite decades of experimental and modelling studies, the exact underlying mechanisms behind hydrogen embrittlement remain elusive. To unlock understanding of the mechanism and thereby help mitigate the influence of hydrogen and the associated embrittlement, it is essential to examine the interactions of hydrogen with structural defects such as grain boundaries, dislocations and stacking faults. Atom probe tomography (APT) can, in principle, analyse hydrogen located specifically at such microstructural features but faces strong challenges when it comes to charging specimens with hydrogen or deuterium. Here, we describe three different workflows enabling hydrogen/deuterium charging of site-specific APT specimens: namely cathodic, plasma and gas charging. We discuss in detail the caveats of the different approaches in order to help future research efforts and facilitate further studies of hydrogen in metals. Our study demonstrates successful cathodic and gas charging, with the latter being more promising for the analysis of the high-strength steels at the core of our work.

Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approach

A major drawback of atom probe tomography (APT) experiments of complex samples is the demanding and rather time consuming specimen preparation via the lift-out process. It usually requires a skilled operator for focused ion beam (FIB) preparation, and frequently overbooked FIB workstations represent a major bottleneck in sample throughput. Within this work, the authors present an alternative approach for APT specimen preparation of functional films and coatings on Si substrates via anisotropic wet-chemical etching. Utilizing this simple, yet effective approach, a freestanding section of the film to be investigated can be fabricated in a few steps. After the etching procedure, freestanding film posts and subsequently APT specimen can be easily prepared by basic FIB milling operations without the need for a lift-out process. Hence, this approach reduces FIB efforts to a minimum in terms of complexity and required machine utilization.

Hydrogen and deuterium charging of site-specific specimen for atom probe tomography

Hydrogen embrittlement can cause a dramatic deterioration of the mechanical properties of high-strength metallic materials. Despite decades of experimental and modelling studies, the exact underlying mechanisms behind hydrogen embrittlement remain elusive. To unlock understanding of the mechanism and thereby help mitigate the influence of hydrogen and the associated embrittlement, it is essential to examine the interactions of hydrogen with structural defects such as grain boundaries, dislocations and stacking faults. Atom probe tomography (APT) can, in principle, analyse hydrogen located specifically at such microstructural features but faces strong challenges when it comes to charging specimens with hydrogen or deuterium. Here, we describe three different workflows enabling hydrogen/deuterium charging of site-specific APT specimens: namely cathodic, plasma and gas charging. We discuss in detail the caveats of the different approaches in order to help with future research efforts and facilitate further studies of hydrogen in metals. Our study demonstrates successful cathodic and gas charging, with the latter being more promising for the analysis of the high-strength steels at the core of our work.